Yes, absorption can be directly measured using photothermal deflection spectroscopy, in which measured changes in refractive index determine the amount of light absorption. scatter can be measured directly using a scatterometer or atomic force microscope (AFM). An AFM creates a highly accurate topological map of the sample and measures its roughness, which can then be used to calculate scatter.
or view regional numbers
enter stock numbers to begin
Copyright 2020, Edmund Optics Inc., 18 Woodlands Loop #04-00, Singapore 738100
California Consumer Privacy Act (CCPA): Do Not Sell My Information