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Image Analysis Test Targets

Image Analysis Test Targets are used to evaluate or calibrate an image system's performance by measuring image quality standards such as resolution, contrast, or depth of field. Image Analysis Test Targets detail a range of shapes or patterns that measure the accuracy of an imaging system by viewing them with an imaging lens. Image Analysis Test Targets effectively determine the capabilities of an imaging system, allowing for accurate certification of performance as well as for establishing baseline standards for multiple systems working together.

DOF 5-15 Depth of Field Target
  • Test Depth of Field of Your Imaging System
  • Effective Measurement Eliminates the Need for Calculations

Dot and Square Calibration Target
  • Designed for Measurement Calibration
  • Positive or Negative Chrome Patterns on Glass
  • High Contrast Target for Imaging with Elements from 0.5 to 10mm
  • NIST Traceability Certificate Included

Dual Axis Linear Scale Stage Micrometer
  • Dual Axis Design
  • English and Metric Scales
  • NIST Certified Version Available

EO Machine Vision Stage Micrometers
  • NIST Traceable Certificate of Accuracy Included
  • Ideal for Quick Calibration of Vision Systems
  • Durable Storage Case Included

EO Telecentricity Target
  • Critical Tool for Measurement Vision Systems
  • Calibrates Any Type of Lens
  • Covers Large Range of Magnifications

Image Analysis Micrometer
  • Designed for Measurement Calibration

Kodak Imaging Chart
  • Over 18 Test Patterns
  • 8 ½" x 11" Film

Micro Line and Dot Standard Stage Micrometer
  • New Opal Version Available
  • Calibrate Pixel Dithering
  • Lines and Dot Range from 2μm to 100μm

Multi-Function Calibration Target for Low Magnification Systems
  • Calibrates Systems from 0.08X to 4X
  • Measures MTF, DOF, Resolution, FOV, and Distortion
  • NIST Certificate of Accuracy Included

Multi-Function High Magnification Calibration Targets
  • Designed for Measurement Calibration; Ideal for Microscopes and Machine Vision Systems
  • Includes Ronchi Rulings, Concentric Circles, Square Grids, and a Linear Microscale
  • Two Targets Available for Different Magnifications
  • NIST Certificate of Accuracy Included

Multi-Grid Standard Stage Micrometer
  • Calibrate Distortion in High Magnification Systems


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